Technique for Automating DC Reliability Measurement of Multiple Metal-Insulator-Metal (MIM) Rectifiers

David Etor; Isaiah A.  Akintunde; Kishak Z.  Cinfwat; Aliyu S.  Nuhu

David Etor University https://orcid.org/0000-0003-0050-6186
Isaiah A. Akintunde University of Jos
Kishak Z. Cinfwat University of Jos https://orcid.org/0000-0002-9404-2804
Aliyu S. Nuhu https://orcid.org/0000-0002-5171-675X

Keywords: Metal-insulator-metal (MIM) rectifier, current-stressing, biasing, Mbed, microcontroller, I-V curve

Abstract

An automatic biasing device for characterizing metal-insulator-metal (MIM) rectifiers is presented. The device shows a novel investigational and direct current test approach on MIM rectifiers, where tests are performed on multiple diodes for weeks at the same time, automatically, at specified time intervals and the raw data is saved for further analysis. The developed automatic biasing device makes it easy to determine the nature of the MIM diodes’ rectified current. The developed remote biasing device can also be used for effectively current-stressing multiple MIM diodes, making it a very versatile DC characterization device. Furthermore, the developed method was used to characterize the effect of epoxy encapsulation on the performance of MIM rectifiers with results comparable to the state-of-the-art.

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